This page is a preview of the following resource. Continue onto eagle-i search using the button on the right to see the full record.

Tecnai G2-30 TEM

eagle-i ID

Resource Type

  1. Transmission electron microscope


  1. Resource Description
    The Tecnai 30 G2 TWIN is a 300 kV LaB6 TEM The wide-gap Twin lens pole-piece allows large tilt angles of the specimen making it optimal for diffraction analysis and imaging. The wide-gap pole-piece also allows for a variety of stages and detectors to be used. Although it is not our highest-resolution microscope, it is still capable of 0.24nm point-to-point resolution. 100-300 kV accelerating voltage with LaB6 cathode HAADF STEM, fine probe and Convergent Beam Electron Diffraction (CBED) capability 2.4 Å resolution (Twin lens) with ±70˚ sample tilt (±30˚ on second tilt) 4k CETA TEM camera Large area EDAX SDD X-ray detector with digital beam control Double-tilt, Heating, and Cryo stages for specialized experiments Networked for data storage and Full Remote Operation Individual user accounts to avoid the need for realignments between users.
  2. Additional Name
    Tecnai G2-30 TEM, formerly produced by FEI
  3. Contact
    Center for Electron Microscopy and Analysis (CEMAS) Requests
  4. Access Restriction(s)
    Access hours & Scheduling: Must schedule time in advance to use resource or with specific hours.
  5. Access Restriction(s)
    Cost: Access is available at a set cost to others.
  6. Part of Collection
    Office of Research Collection
  7. Part of Collection
    Institute for Material Research
  8. Location
    Center for Electron Microscopy and Analysis (CEMAS)
Provenance Metadata About This Resource Record
  1. workflow state
  2. contributor
    schen (sadie chen)
  3. created
  4. creator
    schen (sadie chen)
  5. modified