Sample Preparation

eagle-i ID

Resource Type

Properties

1. Fee for service

   Yes

2. Resource Description

   The imaging and analytical facilities at CEMAS are complimented by extensive sample preparation facilities. As well as FIB prep for TEM, there are tools for cutting, grinding, trepanning and ion milling samples. For SEM preparation, there are carbon and gold sputter coaters, which can also be used for replica techniques. The preparation equipment covers a wide range of techniques to handle the large variety of samples that are brought into the facility. It is planned to develop procedures for cryo-preparation of samples for soft material and biomaterial applications. Equipment available for sample preparation: Allied Multi-prep Buehler MiniMet Buehler VibroMet Polisher FEI Vitrobot Mark IV Fichione 1010 Ion mill Fischione 1040 Nanomill Fischione 1070 Plasma Cleaner Fischione 2000 Dimple Grinder Gatan 691 PIPS Keyence VHS600 Microscope Leica ACE600 Sputter Coater Pelco Sputter Coater Southbay 660 Diamond Saw Southbay Technology Wire Saw Streuers Acutom-50 Diamond Saw VCR D500i Dimple Grinder

3. Service Provided by

   Center for Electron Microscopy and Analysis (CEMAS)

4. Part of Collection

   Office of Research Collection

5. Part of Collection

   Institute for Material Research

6. Part of Collection

   The Ohio State University Comprehensive Cancer Center Collection

7. Part of Collection

   The Microscopy Shared Resource (MSR)