Focused Ion Beam/Scanning Electron Microscope, FEI Helios Nanolab 600 Dual Beam

eagle-i ID

http://eagle-i.rf.ohio-state.edu/i/00000174-6df5-2389-b8fb-15ae80000000

Resource Type

  1. Scanning electron microscope

Properties

  1. Resource Description
    Focused Ion Beam/Scanning Electron Microscope, FEI Helios Nanolab 600 Dual Beam
  2. Contact
    Denis Pelekhov
  3. Part of Collection
    Office of Research Collection
  4. Part of Collection
    Institute for Material Research
  5. Location
    Nanosystems Laboratory
 
RDFRDF
 
Provenance Metadata About This Resource Record