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Center for Electron Microscopy and Analysis (CEMAS)

Summary:

CEMAS is a core facility at The Ohio State University established through funding from the Department of Materials Science and Engineering, the College of Engineering, the Office of Research, the Office of Academic Affairs, the Institute for Materials Research at Ohio State, and by the Ohio Development Services Agency and Ohio Board of Regents through the Ohio Third Frontier Program.

The vision of the Center for Electron Microscopy and AnalysiS (CEMAS) is to disrupt the stratification of disciplines in the characterization of materials. We will bring together multidisciplinary expertise to drive synergy and amplify our characterization capabilities, and thus challenge what is possible in electron microscopy. CEMAS has become the hub for business and academia for materials characterization. Our point of difference is our world-class multidisciplinary approach that enables academic and business partners to "see more" than ever before. We are the Center that breaks through the current characterization limitations in medicine, environmental science, energy materials, and beyond.

Our mission is:

To deliver a world-class capability that positions it as the leading Center in analytical electron microscopy in the world
To be the hub for multidisciplinary imaging research in physical and biological sciences at Ohio State
To revolutionize teaching and learning in advanced characterization techniques for students and researchers
To provide a flexible approach to allow external partners to access world-class characterization instrumentation and expertise
To be at the leading edge in the development of new techniques and method for electron microscopy.

Affiliations:

People:

    Resources:

    Instruments

    • Helios NanoLab 600 DualBeam ( Scanning electron microscope )

      The Helios NanoLab™ 600 is equipped with an extremely high resolution Elstar™ electron column with a Field Emmission Gun (FEG) electron source. It is capable of <1nm @ 15kV and <2.5nm at 1kV electron beam resolution. The Ga+ ion source can image and machine down to 5nm resolution levels. Adding to the imaging and sputtering capabilities are a light element X-ray EDS detector and an electron back scatter diffraction orientation imaging camera. The OmniProbe AutoProbe™ 200 in-situ sample lift-out system allows the preparation of site specific TEM samples without the need for support films. This is necessary to fully utilize the high resolution capability of modern TEMs such as the Titan. The combined sputtering and imaging and analytical capability makes DualBeam FIBs extremely versatile and a key component in a world class nano-characterization facility.

    • Nova NanoLab 600 DualBeam ( Scanning electron microscope )

      The Nova NanoLab™ DualBeam FIB has high resolution electron (1.5nm) and ion (5nm) columns. The Nova is equipped with a Sirion™electron column with a Field Emmission Gun. It has high resolution capabilities with accelerating voltages ranging from 30kV to as low as 500V with an innovative "Through the Lens" detector technology. As of December of 2012 has been equiped with an OmniProbe AutoProbe™ 200 in-situ sample lift-out system. This allows the preparation of site specific TEM samples without the need for support films. The Nova has an integrated TSL EBSD package to allow for orientation imaging. The system also has "Run Script" and "Slice and View" scripting packages for 3-D reconstruction from serial sectioning (FIB-tomogrpahy) of the sample. The 3-D reconstructions are very important for understanding the the true 3 dimensional morphology of todays engineering materials. The Nova is equiped with light element EDS X-ray detector. The piezo electric stage is ideal for machining micro compression pillars for very small scale mechanical property testing. The Nova was recently equiped with a Nanomechanics InSEM mechanical properties microprobe. The InSEM features a precision nanomechanical actuator, which provides you with highly resolved force and displacement measurements. Now materials and micro compression pillar can be tested in situ even at elevated temperatures.

    • Quanta 200 SEM ( Scanning electron microscope )

      The Quanta 200 Scanning Electron Microscope (SEM) is a flexible, general purpose, simple-to-use instrument that can be operated in either regular high-vacuum or low-vacuum modes, enabling users to image a wide variety of samples. This ease of use allows users to start collecting data quickly after their initial training, along with making the instrument an excellent hands-on teaching platform for various Materials Science courses.

      The electron beam in this instrument is generated by a conventional tungsten filament electron source, which, under optimal conditions, is capable of resolving features as small as 3 nm. The Quanta is equipped with standard Secondary Electron (SE) and Back Scatter Electron (BSE) detectors, in addition to an Energy Low magnification secondary electron image of sugar crystals on carbonDispersive X-ray Analysis (EDS) detector and an internal TV camera.

      Features of the Quanta200 include:
      • SE, BSE, and EDS Detectors
      • Accelerating voltage between 200 V and 30 kV
      • 3.0 nm resolution at 30 kV
      • 10 nm resolution at 3 kV
      • EDAX 60 mm2 Octane Super EDS detector

    • Rigaku MiniFlex 600 ( Diffractometer )

      The Rigaku MiniFlex 600 is a compact benchtop theta:2-theta diffractometer. It is computer controlled and fully capable of providing qualitative and quantitative analyses for unknown powder crystalline materials. Its fail-safe radiation enclosure ensures the safety of users operating the machine. By comparing the resulting spectra with diffraction data stored in the computer's card file system, the structure can be identified. With its straightforward user interface, the MiniFlex easily lends itself to classroom use and is currently being used in undergraduate materials characterization labs at the Ohio State University.

    • Rigaku SmartLab ( Diffractometer )

      The CEMAS SmartLab XRD is our most flexible diffractometer. It has the ability to run in many different modes with the system providing guidance for the user in preparing data acquisition. The Guidance™ software leads the user step-by-step through acquisition setup and provides for automated alignments before data collection.

      The Cross-Beam Optics™ (CBO) allows rapid switching between diverging (Bragg-Brentano) and parallel beam modes. For ultra-high resolution work, the system includes a 4-bounce Ge (220) monochromator (source) and a 2-bounce Ge analyzer (detector). To minimize fluorescence issues, a Diffracted Beam Monochromator (DBM) can be inserted. This is especially useful in reducing background when analyzing Co, Fe, and Mn containing samples.

      The “in-plane” arm provides the ability to do in-plane grazing incidence scans. It also gives the ability to do pole-figure measurements.

      Configurations

      Parafocusing Bragg-Brentano XRD for powder and polycrystalline film samples. Texture and orientation analysis. With or without DBM

      Parallel beam: Grazing incidence XRD for thin film polycrystalline thin films samples, medium resolution x-ray reflectivity (XRR).

      Parallel beam multilayer mirror + Ge (220) 4-bounce monochromator: High resolution rocking curve measurement on semiconductor epi-layers and heterostructures. High resolution x-ray reflectivity on thin film and multilayer structures.

      Parallel beam mirror+ Ge (220) 4-bounce monochromator +Ge (220) 2-bounce analyzer: High resolution reciprocal space maps (RSM).

      RX-RY Stage: For surface normal alignment (mis-cut correction).

    • Tecnai F20 TEM ( Transmission electron microscope )

      The Tecnai F20 microscope is a field emission 200kV S/TEM with an X-TWIN objective lens and high brightness field emission electron gun (FEG) optimized for analytical work. This objective lens allows a 40 degree tilt with a standard low-background double tilt holder and, with the tomography holder, allows +/-70 degrees of tilt. The objective lens design allows for efficient collection of X-rays for elemental analysis down to the sub-nanometer level. With a single 30mm2 detector, the EDX acquisition solid angle for collection is ~0.4sr, rivaling more expensive systems. The system has a Gatan Tridiem imaging filter for both energy-filtered imaging and EELS spectroscopy. The various techniques are integrated into the instrument software for ease of operation. The software packages include EDX, EELS, Low-Dose, and Tomography.

      The Tecnai is equipped with 3 CCD cameras. There is an Orius 2k camera in the upper port giving a wide field of view, an UltraScan 2k camera in the lower position for higher magnifications, and an UltraScan 2k camera located after the energy-filter. TEM resolution is 2.4Å with STEM resolution better than 2Å.

    • Tecnai G2-30 TEM ( Transmission electron microscope )

      The Tecnai 30 G2 TWIN is a 300 kV LaB6 TEM The wide-gap Twin lens pole-piece allows large tilt angles of the specimen making it optimal for diffraction analysis and imaging. The wide-gap pole-piece also allows for a variety of stages and detectors to be used. Although it is not our highest-resolution microscope, it is still capable of 0.24nm point-to-point resolution.

      100-300 kV accelerating voltage with LaB6 cathode
      HAADF STEM, fine probe and Convergent Beam Electron Diffraction (CBED) capability
      2.4 Å resolution (Twin lens) with ±70˚ sample tilt (±30˚ on second tilt)
      4k CETA TEM camera
      Large area EDAX SDD X-ray detector with digital beam control
      Double-tilt, Heating, and Cryo stages for specialized experiments
      Networked for data storage and Full Remote Operation
      Individual user accounts to avoid the need for realignments between users.

    • Thermo Scientific Apreo SEM ( Scanning electron microscope )

      CEMAS’s Scanning Electron Microscope (SEM) capabilities underwent an exciting upgrade in autumn 2017 when we installed two new Thermo Scientific Apreo FEG SEMs. These instruments offer a wide variety of capabilities suitable for imaging and analysis of both hard and soft materials, from fracture analysis of welds to high resolution imaging of nanoporous polymers.

      Apreo SEMs are specially designed for imaging with low voltage electron beams, rendering them capable of clearly seeing features under 10 nanometers in size, even in non-conducting materials. In addition to their outstanding imaging capabilities, the Apreo SEMs at CEMAS are highly versatile microscopes equipped with all the analysis tools commonly found on SEMs, including EDS x-ray detectors for composition analysis and EBSD cameras for crystallographic orientation mapping. These microscopes can be operated at typical SEM voltages from 30 kV to 200 V and beam currents spanning over five orders of magnitude from 1 pA up to 400 nA. To assist with imaging and analysis of non-conducting materials, both Apreo SEMs can be operated under low vacuum conditions. In low vacuum mode, a small amount of ionizable gas is introduced into the chamber to assist with neutralizing the electron beam as it interacts with the sample surface. The gas used is typically water, which can be set to a maximum pressure of 500 Pa. This method allows for imaging of materials’ native surfaces without needing to coat them in carbon or metal. Metal coatings can often obscure small-scale features and/or hide subtle variations in composition throughout a material, so avoiding coatings can sometimes reveal information that would otherwise be missed. With some adjustments, all of the instruments’ other analytical tools are still available for use in low vacuum mode.

      In addition to these features, the Apreos’ extensive capabilities include:
      Electrostatic and electromagnetic focusing lenses, which helps achieve sub-nanometer resolutions even on magnetic samples.

      Stage-biasing from -4000 V to +600 V, which creates an electric field between the sample and pole piece to 1) reduce the ‘landing energy’ of electrons when they hit the sample surface, 2) boost signal on the in-column detectors, and 3) facilitate analysis of non-conducting samples.
      Versatile imaging detectors that drastically increase our ability to see different types of features in samples, including:

      • Traditional Everhart-Thornley Detectors (ETD) for surface and topographical imaging using secondary electrons
      • The Trinity suite of in-column detectors for high resolution imaging of both backscatter and secondary electron signals
      • Retractable directional backscatter (DBS) detector with optional segmentation of either annular signals (ABS) for topographical backscatter imaging, or concentric signals (CBS) for enhanced composition and/or grain orientation contrast
      • Retractable STEM detector for analysis of TEM specimens in the SEM
      • Retractable Cathodoluminescence (CL) Detector for directly imaging red, blue, and green light generated by certain materials when exposed to high energy electrons, such as semiconductors and geological samples.

      Easy and rapid analysis of multiple samples thanks to a Multi-Purpose Stagein conjunction with a NavCam chamber mounted optical camera, which together allow users to load multiples samples and quickly navigate from one sample to the next with the Sample Navigation feature.

      Four-quadrant imaging, capable of simultaneously collecting images from four different detectors at resolutions up to 6144 x 4096 pixels.

      Active drift compensation for efficient auto-alignment of overlaid images to produce high signal-to-noise ratio final images, even if the sample moves slightly during image acquisition.

      Plasma cleaners for automated in-situ sample and chamber cleaning.
      MAPS software for automated collection, stitching, and blending of large area, high-resolution tiled images.

      Platinum deposition system for patterning and depositing fiducial marks. Remote operation capabilities from the CEMAS virtual learning digital theater and beyond, allowing users at other locations to fully utilize these instruments for teaching and research.

    • Thermo Scientific Glacios Cryo-TEM ( Cryogenic transmission electron microscope )

      CEMAS offers access to a comprehensive suite of instruments needed for cryo-electron microscopy (cryoEM) research that encompasses the entire workflow from sample preparation to data analysis. This powerful technique allows for the observation of biological specimens in their native environment by embedding the samples in vitreous ice. Recent advances in camera technology and data processing have made it possible to determine molecular structures at near-atomic resolution. CryoEM has transformed structural biology, and its use is expanding into other fields such as small molecule crystallography, infectious disease, and cell biology.

      In late 2018, CEMAS installed the Thermo Glacios cryoEM which has a 200 kV x-FEG source and can be configured for single particle analysis (SPA), tomography, and other applications.

      Sample screening and data acquisition

      The Glacios cryoEM is the ideal microscope for screening, prior to transfer of samples to the Krios G3i for ultimate-resolution data acquisition. While it is considered a screening microscope, our Glacios is configured with a direct electron detector making it a standalone SPA data acquisition solution. In addition, the Glacios can be used to characterize the size and shape of biological samples or soft materials (such as lipids or polymers) under physiological conditions.

      Maximum throughput

      nanoparticle sampleNanoparticle sample imaged on Glacios. Image taken by Binbin Deng.With full control of the Autoloader, a robotic sample handler, all 12 grids in an Autoloader cassette can be batch-screened. This screening process involves collecting a low magnification grid atlas and determining ice quality (presence, thickness) of the vitrified grids. This information can then be utilized to support the guided selection of grid squares.

      Direct electron detector

      The Falcon 3EC 200 kV allows for the direct detection of electrons in low-dose imaging applications dedicated to a 200 kV TEM. Its sensitivity has been increased by further backthinning of the sensor. As a result, the DQE in integrating mode has increased significantly at 200 kV (DQE @ 1/2 Nq in integrating mode: ≥ 0.3).

      Falcon 3EC 200 kV is fully integrated in the Thermo Fisher architecture and dedicated protection software prevents over-exposure and ensures that the camera for direct detection is only illuminated under low-dose conditions. A Ceta 16M is part of the microscope configuration and used for surveying the specimen and performing alignments.

      Microcrystal electron diffraction (MicroED)

      CEMAS has upgraded the Glacios with the MicroED package offered by Thermo Fisher Scientific, which includes the Ceta-D camera upgrade along with additional apertures, a modified beamstop, and EPU-D data collection software. The Ceta-D features a scintillator that has been optimized for low dose diffraction experiments. This camera modification has two main effects: (1) reduces noise levels by a factor of 5/increases SNR and (2) improves the DQE(0) by 1.5. Currently, CEMAS staff is working to validate the MicroED workflow for small molecule and protein crystals.

      Enhanced ease-of-use through automation

      The EPU software has been further streamlined to become the single user interface for the SPA workflow, providing comprehensive user guidance, as well as access to automated routines for regularly recurring alignments.

    • Thermo Scientific HeliScan microCT ( Computed tomography scanner )

      HeliScan™ uses advanced helical scanning and iterative reconstruction technology to produce unsurpassed image fidelity on larger volumes. As part of a multi-scale imaging solution, HeliScan™ enables scientists to gain valuable insight from internal structures to explore and validate a wide range of material properties.

      The variety of materials that can be easily characterized in this system range from biological specimens to dense metallic, even micro-electronics. The ease of use as well as the high throughput make this system ideal for laboratory groups that need to identify what is within their material (voids, cracks, solutes) without requiring a sacrificial specimen.

    • Thermo Scientific Krios G3i Cryo-TEM ( Cryogenic transmission electron microscope )

      CEMAS offers access to a comprehensive suite of instruments needed for cryo-electron microscopy (cryoEM) research that encompasses the entire workflow from sample preparation to data analysis. This powerful technique allows for the observation of biological specimens in their native environment by embedding the samples in vitreous ice. Recent advances in camera technology and data processing have made it possible to determine molecular structures at near-atomic resolution. CryoEM has transformed structural biology, and its use is expanding into other fields such as small molecule crystallography, infectious disease, and cell biology.

      In the spring of 2019, CEMAS installed the Thermo Scientific Krios G3i cryoEM which has a 300 kV x-FEG source and can be configured for single particle analysis (SPA), tomography, and other applications.

      High resolution performance

      The Krios cryoEM has a proven track record of producing high resolution molecular structures including the majority of published structures below 4 Å. These high-resolution structures were achieved in part because of the system’s stability (reduced thermal drift) during data acquisition sessions. The microscope is configured with a three-condenser lens system for continuous, parallel sample illumination.

      Gatan BioQuantum energy filter and K3 camera

      The Krios is equipped with a post-column Gatan BioQuantum energy filter that removes inelastically scattered electrons before reaching the detector. This filter enhances contrast in the image, which can improve particle alignment and overall map resolution.

      The energy filter is paired with the newest direct electron detector from Gatan – the K3 camera. Both the energy filter and camera are suited for low-dose imaging applications with the highest DQEs available. The K3 sensor has a field of view of 24 megapixels (5,760 x 4,092), which is 1.6 times the size of the K2 camera. Additionally, the K3 can capture 1,500 full frames per second (3.75 times the speed of the K2 camera).

      Additional configurations

      Included on the Krios is a phase plate solution that enhances the contrast of small particles (below 200 kDa) without having to work at large defocus values, thereby compromising low resolution information. This will be particularly beneficial for those interested in cryo-electron tomography as it allows each tilt image to be collected at a lower electron dose and reduces sample damage.

      This microscope is also equipped with a Cs image corrector that not only minimizes the spherical aberration but other common aberrations.

      Workflow connectivity

      Like the Glacios, the Krios is equipped with an Autoloader system, a robotic sample handler, which can hold up to 12 grids per batch. It is expected that users will pre-screen their samples on the Glacios before placing them in the Krios. Because of the compatibility of the Autoloaders, samples can be easily transferred from the Glacios to the Krios without contamination.

      Enhanced ease-of-use through automation

      EPU software is the native software package for single particle data acquisition (separate tomography software is available). EPU is capable of batch-screening samples and categorizes grids by ice thickness to further expedite data collection. The program automates data collection from different grid squares and optimizes conditions before collecting images.

    • Thermo Scientific Quattro ESEM ( Scanning electron microscope )

      The Thermo Scientific Quattro Environmental Scanning Electron Microscope (ESEM) is fully equipped with extensive analytical and in situ capabilities. The instrument’s field emission gun (FEG) allows for high resolution imaging of samples with available detector options that include the standard Everhart Thornley detector (ETD) and low vacuum detectors for secondary electron imaging; a retractable directional backscatter detector for phase and channeling contrast; and a retractable STEM detector for ultra-high-resolution imaging of electron-transparent samples.

      The Quattro can be operated over a wide range of accelerating voltages (200 V – 30 kV) and currents (1 pA – 200 nA), with a maximum secondary electron imaging resolution of 3.0 nm at 1 kV, or 0.8 nm at 30 kV when operating in STEM mode. Low vacuum imaging is possible in the available ESEM mode up to 4000 Pa (30 Torr), along with other tunable ‘real world’ chamber conditions, including control over temperature, humidity, and partial pressure of reactive gases. These tunable parameters allow for convenient analysis of samples that are charging, outgassing, or otherwise not high-vacuum compatible.

      Take advantage of the Quattro's diverse array of capabilities and become a CEMAS User.

      In situ Characterization

      Heating stage: Temperatures achievable up to 1100 °C, EBSD compatible up to 900 °C.

      Cooling stage: Peltier cooling stage for analysis of samples at temperatures down to -25 °C and up to 100 % relative humidity in ESEM mode. Compatible with secondary, backscatter, or STEM imaging.

      CryoMAT stage: Temperature controlled stage capable of use down to -190 °C, compatible with the QuickLoader load lock system to avoid venting the entire chamber for sample exchange.

      Kammrath-Weiss tensile stage: Tensile and compression module with testing capabilities up to 5 kN, heating to 800 °C, and EBSD compatibility.

      Analytical Capabilities

      EDAX Octane Elect super 70mm2 EDS:High count silicon-drift detector with a thin silicon nitride window for detection of light elements.

      EDAX Velocity EBSD camera: Newly designed CMOS sensor capable of 4,500 indexed points per second and located coplanar with the EDS detector.

      Horiba H-Clue Cathodoluminescence detector: Wide spectral range cathodoluminescence multidetector system for imaging and spectroscopy from the UV to NIR.

      STEM imaging of sputtered gold at 30 kVAdditional Features
      QuickLoader: Load lock designed for fast sample transfer with no need to vent and pump the entire SEM chamber. Compatible with STEM, CryoMAT, and general SEM imaging.

      Electrical Feedthroughs: Multiport for electrical signals (up to 7) allowing additional electrical stimuli to be applied to the samples and novel detection schemes.

      Fast Beam Blanker: Electrostatic beam modulation for fast diversion of the electron beam to lower beam exposure to sample. Rise/fall times of <20 ns and a maximum blanking rate of 1 MHz.
      MAPS: Software for automated image collection and stitching multiple images at high resolution over large areas.

      Cryocleaner: Remove contamination and achieve a higher vacuum level than normal operating condition.

      NavCam: Optical image of stage for ease of sample navigation on multiple samples or large areas.

      Beam Deceleration: Stage bias of -4000 V to +50 V allowing for increased resolution at low landing energies (down to 20 eV) and provide additional signal of backscatter electrons at low landing energies.

    • Thermo Scientific Themis Z S/TEM ( Transmission electron microscope )

      The S-CORR probe corrected Themis-Z™ is equipped with a high coherence, high brightness, field emission electron gun (X-FEG), and an electron gun monochromator to provide useable probe current with an energy resolution of 0.10 eV. Our Themis-Z™ delivers imaging capabilities for atomic resolution in both high resolution TEM and STEM, at accelerating voltages of 60, 200 and 300 kV. STEM resolution down to <63 pm is possible, with appropriate samples, and the system is equipped with a S-TWIN pole piece, this provides a wide-gap for more experimental work and tilting.

      The system contains a high-speed, high-throughput, quad-silicon drift detector (Super-X) optimized for rapid x-ray collection and when combined with STEM enables EDS spectral mapping down to the atomic scale. This system is also equipped with Gatan Digiscan™ to produce high-speed spectral maps from electron energy loss spectroscopy (EELS) data. A dual-EELS spectrometer permits the user to collect low-loss and core-loss EELS simultaneously to produce, rapidly and routinely, atomic resolution EELS spectrum images.

      To improve reproducibility, the user has access to OptiMONO and OptiSTEM+, both are software that align, automatically, the monochromator and the imaging probe to remove user error and reach the ultimate resolution most quickly. The system is also equipped with a 4-segment annular detector and the EMPAD pixelated detector enabling differential phase contrast imaging (DPC) and integrated differential phase contrast imaging (iDPC), just to list a few. The combinations of these spectral collection tools, energy resolution and variable voltage make the probe corrected Themis-Z™ a powerful characterization tool in the modern materials world.

      The system is housed in an acoustic, thermal, and electro-magnetically isolated, high-stability support box that reduces negative environmental conditions permitting optimal aberration corrected S/TEM characterization to be realized. The instrument is also available for remote viewing access and remote user control providing benefits and access to users both locally and around the state of Ohio through OARnet.

    • Titan 60-300 TEM ( Transmission electron microscope )

      The image-corrected Titan3™ G2 60-300 S/TEM provides superior performance, stability, and flexibility when utilizing the Cs image-corrector and electron monochromator technology for atomic resolution imaging and spectroscopy. The system provides flexibility of operating voltages at 60, 160 and 300 kV. Additionally, with the relatively wide pole piece gap of the S-TWIN lens, the Titan3™ G2 60-300 is designed for dynamic experiments, with space around the sample area. The microscope is optimized for a 130pm probe resolution and 70 pm information limit to facilitate atomic resolution imaging with local spectroscopic and x-ray data collection to complement the capabilities of its sister CEMAS instrument, the probe-corrected Themis-Z™.

      The Titan3™ 60-300 is equipped with a high coherence, high brightness, field emission electron gun (X-FEG), a Cs- image corrector and an electron gun monochromator to provide useable probe current with an energy resolution of 0.15 eV. The Titan3™ G2 60-300 contains a high-speed, high-throughput, quad-silicon drift detector (Super-X/ChemiSTEM) optimized for rapid x-ray collection and when combined with STEM enables EDS spectral mapping down to the atomic scale. This system is also equipped with Gatan Digiscan™ to produce high-speed spectral maps from electron energy loss spectroscopy (EELS) data. A dual-EELS spectrometer permits the user to collect low-loss and core-loss EELS simultaneously to produce, rapidly and routinely, atomic resolution EELS spectrum images. We have two cameras for spectroscopy collection, the K2 direct electron detector and the gatan imaging filter(GIF). The combinations of these spectral collection tools, energy resolution and variable voltage make the image corrected Titan3™ G2 60-300 a powerful characterization tool in the modern materials world.

      The system is housed in an acoustic, thermal, and electro-magnetically isolated, high-stability support box that reduces negative environmental conditions permitting optimal aberration corrected S/TEM characterization to be realized. The instrument is also available for remote viewing access and remote user control providing benefits and access to users both locally and around the state of Ohio through OARnet.

    Resource Collection

    • Center for Emergent Materials Collection ( Resource Collection )

      NSF Funding Acknowledgment Language
      It is vital that publications resulting from CEM funding acknowledge the grant, including the grant number (DMR-2011876). The NSF will not credit CEM for publications if the grant number is missing or incorrect. Publications acknowledgements are an important factor in demonstrating the center’s level of performance. It is necessary for the continued success of the center that the CEM is properly acknowledged.

      The NSF closely examines acknowledgements in all CEM publications to determine if CEM should be credited, and to determine whether the research was primarily or only partially supported by CEM. If CEM is the primary source of support either state primary support explicitly or avoid the use of language suggesting partial support.

      Primary Support
      (> 50% support from CEM; students, post-docs, materials/supplies, facilities, user fees, etc.)

      “Funding for this research was provided by the Center for Emergent Materials: an NSF MRSEC under award number DMR-2011876.”
      Partial Support
      (< 50% support from CEM; students, post-docs, materials/supplies, facilities, user fees, etc.)

      “We acknowledge partial support from the Center for Emergent Materials: an NSF MRSEC under award number DMR-2011876.”
      Facilities
      (No direct support for students, etc., but research and subsequent publication directly impacted by use CEM-funded facilities)

      “Funding (or Partial funding) for shared facilities used in this research was provided by the Center for Emergent Materials: an NSF MRSEC under award number DMR-2011876.”

    • School of Earth Sciences ( Resource Collection )

    Services

    • Consulting on Experimental Design and Electron Microscopy and Analysis equipment and services ( Support service )

      Experimental design assistance and consultation on selecting the proper equipment.

    • Sample Preparation ( Material processing service )

      The imaging and analytical facilities at CEMAS are complimented by extensive sample preparation facilities. As well as FIB prep for TEM, there are tools for cutting, grinding, trepanning and ion milling samples. For SEM preparation, there are carbon and gold sputter coaters, which can also be used for replica techniques. The preparation equipment covers a wide range of techniques to handle the large variety of samples that are brought into the facility. It is planned to develop procedures for cryo-preparation of samples for soft material and biomaterial applications.

      Equipment available for sample preparation:
      Allied Multi-prep
      Buehler MiniMet
      Buehler VibroMet Polisher
      FEI Vitrobot Mark IV
      Fichione 1010 Ion mill
      Fischione 1040 Nanomill
      Fischione 1070 Plasma Cleaner
      Fischione 2000 Dimple Grinder
      Gatan 691 PIPS
      Keyence VHS600 Microscope
      Leica ACE600 Sputter Coater
      Pelco Sputter Coater
      Southbay 660 Diamond Saw
      Southbay Technology Wire Saw
      Streuers Acutom-50 Diamond Saw
      VCR D500i Dimple Grinder


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    Last updated: 2021-03-15T10:53:10.535-04:00

    Copyright © 2016 by the President and Fellows of Harvard College
    The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016